Skip to header Skip to main navigation Skip to main content
Under Construction

Site branding

Home
Global Communication Semiconductors, LLC
Quality First

Search

Main navigation

  • Home
    • About Us
    • Quality Policy
    • AS9100 ISO Certificate
  • Advanced Optical Products
    • Advanced Optical Components
      • GaAs PIN Photodiodes
      • InGaAs PIN Monitor Photodiodes
      • InGaAs PIN Photodiodes
      • VCSEL Chips and Arrays
  • Opto Foundry
      • Optoelectronics Technologies
    • Optoelectronics Wafer Foundry
  • RF Foundry
    • Overview
      • GaN HEMT
        • 0.15µm GaN-on-SiC HEMT
        • 0.25µm GaN-on-SiC HEMT
        • 0.40µm GaN-on-SiC HEMT
        • 0.25µm GaN-on-Si HEMT
      • GaAs
          • High-fT GaAs HBT
          • Super High ƒmax HBT
          • VCO InGaP HBT
          • 0.25µm and 0.5µm Power pHEMTs
          • 0.25µm Low-Noise pHEMT
          • 0.1µm Low-Noise and Power pHEMT
          • THz Schottky Diode
          • Varactor Diode
          • RF PIN Diode
        • Integrated Passive Devices
      • InP HBT
      • Foundry Support Flow
      • Process Design Kit
      • Testing Services
      • Foundry Partners
  • Contact
    • Information Request
    • Sales Request

Breadcrumbs

Breadcrumb

  • Home
  • GaAs Technologies
  • 0.1µm Low-Noise and Power pHEMT

Main page content

 
RF Semiconductor Foundry

0.1µm LN & Power pHEMT

 

Process Summary

 

Uses EBL gate lithography and is ideal for mmW transceiver components. It is suitable for commercial and aerospace & defense applications and meets or exceeds environmental requirements.

Typical Applications up to V-Band

 
  • Transceiver Components
  • High Power Amplifiers
  • Low Noise Amplifiers
  • Gain Blocks
  • Switches

Key Features

 
  • EBL Gate Lithography
  • Excellent Reliability
  • Backside Round & Slot Via Process
  • Hot Via Process
  • High Level MMIC Implementation

Typical Device Performance

 
0.1µm Power pHEMT Process
0.1µm Power pHEMT Process
0.1µm LN pHEMT Process
0.1µm LN pHEMT Process

Device Performance Table

 
ParameterLNPower
Imax (mA/mm)440430
Idss (mA/mm)220322
Gm (mS/mm)430383
Vp (V)-0.5-1.03
BVgd (V)>7>16
fT (GHz)8058
fmax (GHz)170>210
P_density (mW/mm)NA630
NFmin @ 6 GHz [dB]0.40.49
Gass @ 6 GHz [dB]17.714.8
NFmin @ 12 GHz [dB]0.470.76
Gass @ 12 GHz [dB]12.510.9
NFmin @ 18 GHz [dB]0.550.98
Gass @ 18 GHz [dB]11.09.3
NFmin @ 30 GHz [dB]*1.2N/A
Gass @ 30 GHz [dB]*9.0N/A
  • Products
  • Services
  • Sitemap
  • Careers
  • Contact
  • News
  • ESG
  • Terms of Use
  • GCS Holdings (opens in new tab)

Copyright © 2026 Global Communication Semiconductors, LLC - All rights reserved

CMS by GCS